CLUSTERLINE® 300

Cluster architecture for 300mm

 

Secure 300mm wafer handling across Advanced Packaging, Power Devices and Wafer Level Optics

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Wafer Level Packaging

  • Superior management of contact resistance and layer uniformities for applications including WLCSP, FOPLP and 2.5/3D device synthesis
  • Backside metallization processes for applications including Artificial Intelligence
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Power Devices

  • Front and backside processes with over 50 years production process know how on Si
  • Supporting Industry  innovation with new processes e.g Cu for front side contact technology
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Wafer Level Optics

  • Low particles and precision for processes on high value wafers
  • 300mm processes supporting growth of high volume consumer applications including Augmented Reality

Overview

CLUSTERLINE® 300 is a Swiss-engineered modular cluster platform built for high performance, durability, and scalability. Designed to meet the demands of high-mix, high-yield fabs, it supports single wafer processing through configurable Single Process Modules (SPM) and various pre- and post-treatment capabilities.

The architecture supports integration of PVD, PVE, and High Pressure Degasing (HPD) and Cooling – all within a single vacuum environment. Its modular design ensures fast upgrades, isolated maintenance, and long-term cost efficiency.

At the center of the system there is the Vacuum Transfer Module (VTM9E) enabling:

  • Up to 6 treatment units for substrate conditioning and more
  • 1 to 6 process module ports for SPM or HPD integration
  • Fully automatic High Volumen Manufacturing (HVM) capabilities with automatic load ports including SEMI compliance for industry 4.0
  • Pre-Alignment station, Wafer flipping station for back side metallization and buffer station for up to 12 wafers.
  • Evatec unique Atmospheric Batch Degassing station (ABD)
  • Compatible with numerous substrates types of heavy, bowed, glass, transparent, highly reflective
  • Thin wafer handling capability down to 100 μm and wafer bow up to 6mm;
  • Up to 4 process gases, including UHP capability
  • automatic wafer dependent tool settings
  • Turnkey Solution with minimal maintenance requirements

The architecture supports integration of PVD, PVE, and High Pressure Degasing (HPD) and Cooling – all within a single vacuum environment. Its modular design ensures fast upgrades, isolated maintenance, and long-term cost efficiency.

System Highlights

Choose CLUSTERLINE® 300 for Wafer Level Packaging, Backside Metallization / Thin Wafer Processing and selected applications in Optoelectronics.

  • Integration of single process modules for PVD, highly ionized PVD, and Soft Etch
  • Thin wafer handling capability down to 100 μm and wafer bow up to 6mm;
  • 200/300mm bridge or split tool compliant
  • New Degas and Artic dome etch technology for handling strongly outgassing organic substrates in WLP applications
  • Load Port Modules with 300mm FOUP load ports or open cassettes for 200mm
  • Wafer aligner for rotational pre-alignment (0.3°) and centering of wafers (0.05mm)
  • SCARA robot options with 5-axis
  • Wafer flip station for back side metallization and buffer station for up to 6 wafers
  • Integration of up to six single substrate processing

Configuration

• Magnetically driven robot system with dual bi-symmetric arms
• Production-proven wafer handling and processing capability for thin wafers
• Most accurate wafer placement and automatic wafer alignment correction under vacuum
• Integration of up to six single substrate processing modules (SPMs), 2 batch drum modules (BMD) or a mixture

Process Modules / Components

  • ICP soft etch module - SiO2 removal rate, 0.6 - 0.8 nm/sec
  • Highly ionized PVD source for high aspect ratio TSV applications - mainly for 3D packaging
  • Controlled chuck temperature from -30 up to 500°C
  • Metal or ceramized chuck with mechanical wafer clamping
  • ESC or clampless chuck with shadow mask
  • Hot or cold ESC for best temperature control
  • Clamped chuck configuration with gas conduction back side heater/cooler for precise temperature control and chuck RF Bias
  • ARQ 310 DC or pulsed DC sputter source with uniformity compensation over target life
  • ARQ 320 RF, RF-DC, DC or pulsed DC sputter source with improved Particle and uniformity.
  • Longlife Targets with direct cooling for COO improvement
  • Multisource with rotating chuck - up to 4 RF or DC sources on one module for single or co-sputter
  • Optional APC with fully integrated Pyrometer and process gas monitor
  • Optimized configuration for organic/mold substrates
  • ICP soft etch process module with MF Plasma enhanced RF Etch enabling high etch rate and excellent uniformity at low bias voltages. Reactive processing with H2, N2, CH4 and O2 is available
  • Cooled Metal Cage (Ice Dome) and arctic chuck cooling down to -30°C, enabling highest kit life in the etch module for organic wafers like PI or PBO
  • Atmospheric Batch Degasser with up top 44 slots for strongly outgassing Advanced Packaging Substrates
  • BMD batch module drum(s) for deposition of soft magnetic layers on 300mm

Process Know-How

Proven process capabilities come as standard when you choose CLUSTERLINE® 300 for a range of applications in Advanced Packaging, Power Devices, and Optoelectronics.

To read more about typical application examples download the CLUSTERLINE® FAMILY brochure or visit the news section of our website. Within LAYERS you can read about applications including OLED on CMOS and Integrated Voltage Regulators assembled directly on the microprocessor package.

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Read more about CLUSTERLINE® 300 in our LAYERS magazine

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Keeping cool with the hottest Technology

Evatec’s new hot chuck and cathode innovations enable PVD-based epitaxial growth on CLUSTERLINE® 300, delivering high-temperature uniformity and low-damage deposition for advanced materials like GaN, BTO, and ITO—paving the way for next-generation device fabrication.

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300mm Frontend Integration

Evatec’s CLUSTERLINE® 300 platform delivers advanced PVD solutions for next-generation device architectures, combining SDS and ADS technologies for superior step coverage, contamination control, and high productivity—paving the way for future integration with ALD and CVD.

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Welcome to Augmented Reality

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